Fast peak detector stretchers for use in XAFS applications

IEEE Nuclear Science Symposium and Medical Imaging Conference

Volumn 1, Issue , 1999, Pages 421-422

  Fabris, L ^a   Allen, P G ^a   Bucher, J J ^a   Edelstein, N M ^a   Landis, D A ^a   Madden, N W ^a   Shuh, D K ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); DELAY CIRCUITS; DIFFERENTIATING CIRCUITS; LOGIC CIRCUITS; NUCLEAR RADIATION SPECTROSCOPY; SIGNAL PROCESSING; X RAYS;

DELAY LINE; PULSE HEIGHT ANALYZER; SINGLE CHANNEL ANALYZER; X RAY ABSORPTION FINE STRUCTURE FLUORESCENCE;

X RAY SPECTROMETERS;

EID: 0032597186     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (1)