Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3740, Issue , 1999, Pages 312-322

  Seebacher, S ^a   Osten, W ^a   Juptner, W ^a   Veiko, V P ^a   Voznessenski, N B ^a  

^a Strahltechnik   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTATIONAL METHODS; GLASS FIBERS; LIGHT EMISSION; MATHEMATICAL MODELS; NUMERICAL METHODS; OPTICAL FIBERS; OPTICAL RESOLVING POWER; SCANNING;

SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM);

OPTICAL MICROSCOPY;

EID: 0032596993     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)