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Volumn 3624, Issue , 1999, Pages 33-39
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Excitonic dephasing effects studied by time- and phase-resolved secondary emission
a
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
CORRELATION METHODS;
ELECTRIC FIELDS;
EXCITONS;
INTERFACES (MATERIALS);
INTERFEROMETRY;
RAYLEIGH SCATTERING;
SEMICONDUCTOR QUANTUM WELLS;
SPECKLE;
TWO DIMENSIONAL;
ULTRAFAST PHENOMENA;
EXCITONIC DEPHASING EFFECTS;
INTERFACE DISORDER;
SPECTRAL INTERFEROMETRY;
SECONDARY EMISSION;
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EID: 0032596929
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
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Times cited : (2)
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References (17)
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