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Volumn 2, Issue , 1999, Pages 1095-1099
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Advantages using pulse shape discrimination to assign the depth of interaction information (DOI) from a multi layer phoswich detector
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTERIZED TOMOGRAPHY;
CRYSTALS;
LIGHT SCATTERING;
MULTILAYERS;
PHOSPHORS;
PHOTONS;
PHYSICAL PROPERTIES;
POSITRON EMISSION TOMOGRAPHY;
SCINTILLATION;
SIGNAL TO NOISE RATIO;
DEPTH OF INTERACTION INFORMATION;
INTERDETECTOR SCATTER SUPPRESSION;
MULTILAYER PHOSWICH DETECTOR;
PULSE HEIGHT DISCRIMINATION;
PULSE SHAPE DISCRIMINATION;
PARTICLE DETECTORS;
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EID: 0032596354
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (1)
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References (3)
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