Stress analysis method considering piezoelectric effects and its application to static strain optic devices

Journal of Lightwave Technology

Volumn 17, Issue 9, 1999, Pages 1626-1633

  Saitoh, Kunimasa ^b,c   Koshiba, Masanori ^a,b   Tsuji, Yasuhide ^a,b  

^a IEEE

^b HOKKAIDO UNIVERSITY   (Japan)

^c Institute of Electronics   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PROPAGATION METHODS (BPM); GUIDED MODE ANALYSIS; STATIC STRAIN OPTIC (SSO) DEVICES;

ELECTROOPTICAL DEVICES; FINITE ELEMENT METHOD; LIGHT POLARIZATION; LIGHT PROPAGATION; LITHIUM NIOBATE; PIEZOELECTRICITY; REFRACTIVE INDEX; STRESS ANALYSIS; SUBSTRATES;

OPTICAL WAVEGUIDES;

EID: 0032595068     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.788568     Document Type: Article

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