Use of a microcavity mode in porous silicon superlattice to enhance band intensities in vibrational spectra

Physica Status Solidi (A) Applied Research

Volumn 175, Issue 1, 1999, Pages 115-120

  Alieva, E V ^a   Kuzik, L A ^a   Mattei, G ^b   Petrov, J H ^a   Yakovlev, V A ^a  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED SPECTROSCOPY; PHOTONS; POROUS SILICON; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON;

FABRY-PEROT MICROCAVITY; VIBRATIONAL BAND INTENSITIES;

SEMICONDUCTOR SUPERLATTICES;

EID: 0032594893     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199909)175:1<115::AID-PSSA115>3.0.CO;2-1     Document Type: Article

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