Feasibility studies on a nanometric oscillator fabricated by surface diffusion for use as a force detector in scanning force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 6 B, 1999, Pages 3954-3957

  Kawakatsu, Hideki ^c   Saya, Daisuke ^c   De Labachelerie, Michel ^a   Hug, Hans J ^b   Güntherodt, Hans J ^b  

^a CNRS   (France)

^b UNIVERSITY OF BASEL   (Switzerland)

^c INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION IN SOLIDS; FORCE MEASUREMENT; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

NANOMETRIC OSCILLATORS; OSCILLATING FORCE DETECTORS; SCANNING FORCE MICROSCOPY;

OSCILLATORS (MECHANICAL);

EID: 0032594483     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.3954     Document Type: Article

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