How does real offset and gain correction affect the DQE in images from X-ray flat detectors?

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3659, Issue I, 1999, Pages 90-97

  Moy, J P ^a   Bosset, B ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL DEVICES; IMAGE SENSORS; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS; X RAY ANALYSIS;

DETECTING QUANTUM EFFICIENCY (DQE); NOISE POWER SPECTRUM (NPS); X RAY FLAT DETECTORS;

MEDICAL IMAGING;

EID: 0032594445     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)