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Volumn 8, Issue 8-9, 1999, Pages 1555-1559

Characterisation of CVD grown diamond and its residual stress state

Author keywords

Adhesion; CVD; Diamond; Residual stress

Indexed keywords

ADHESION; ALUMINUM; CHEMICAL VAPOR DEPOSITION; COATINGS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; FILM GROWTH; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; X RAY DIFFRACTION;

EID: 0032594283     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(99)00028-x     Document Type: Article
Times cited : (25)

References (14)
  • 10
    • 0348066305 scopus 로고
    • V. Hauk, H. Hougardi, E. Macherauch (Eds.), DGM Informationsgesellschaft, Oberursel
    • V. Hauk, in: V. Hauk, H. Hougardi, E. Macherauch (Eds.), Residual Stress Measurements, Calculation, Evaluation, DGM Informationsgesellschaft, Oberursel, 1991.
    • (1991) Residual Stress Measurements, Calculation, Evaluation
    • Hauk, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.