Nanolayered chalcogenide glass structures for optical recording

Nanostructured Materials

Volumn 12, Issue 1, 1999, Pages 417-420

  Kikineshi, A ^a   Mishak, A ^a   Palyok, V ^a   Shiplyak, M ^a  

^a UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CRYSTAL STRUCTURE; CRYSTALLIZATION; DIFFUSION IN SOLIDS; EVAPORATION; GLASS; OPTICAL PROPERTIES; OPTICAL RECORDING; SURFACE ROUGHNESS; THERMODYNAMIC STABILITY;

CHALCOGENIDE GLASS; CYCLIC VACUUM THERMAL EVAPORATION;

NANOSTRUCTURED MATERIALS;

EID: 0032593370     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(99)00148-8     Document Type: Article

References (6)

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3. Shvarts K.K., Physics of Optical Recording in Dielectrics and Semiconductors, Zinatne, Riga (in Russian), 1986, 230.
4. Komnik Yu. F., Physics of Metal Films. Atomizdat, Moscow (in Russian), 1979, 260.
5. Dohler G.H., Optical Engineering, 1986, 25, 211.
6. Mishak A., Kikineshi A., Fedor V., Barna P.B., Kovacs I., Proc.SPIE, 1997, 3055, 25.