Defect passivation using ultrasound treatment: fundamentals and application

Applied Physics A: Materials Science and Processing

Volumn 69, Issue 2, 1999, Pages 225-232

  Ostapenko, S ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DIFFUSION; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; ELECTRON TRAPS; GRAIN BOUNDARIES; MATHEMATICAL MODELS; POINT DEFECTS; SEMICONDUCTING FILMS; SPECTROSCOPY; ULTRASONIC APPLICATIONS; VIBRATIONS (MECHANICAL);

DEFECT PASSIVATION; SCANNING PHOTOLUMINESCENCE SPECTROSCOPY; THREE STEP POINT DEFECT GETTERING; TRAP LIMITED HYDROGEN DIFFUSION; ULTRASOUND TREATMENT;

PASSIVATION;

EID: 0032593257     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050994     Document Type: Article

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