Morphological characterisation of nanocrystals with layered structures

Nanostructured Materials

Volumn 12, Issue 1, 1999, Pages 597-600

  Szabo D V ^a   Vollath, D ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE CONSTANTS; MORPHOLOGY; PLASMA APPLICATIONS; SELENIUM COMPOUNDS; SULFUR COMPOUNDS; SYNTHESIS (CHEMICAL);

LAYERED STRUCTURED; MICROWAVE PLASMA; NANOCRYSTALS; SELENIDE; SULPHIDES;

NANOSTRUCTURED MATERIALS;

EID: 0032593217     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(99)00192-0     Document Type: Article

References (3)

1. Tenne, R., Margulis, L., Genut, M. and Hodes, G., Nature, 1992, 360, 444
2. Vollath, D., Szabó, D. V. and Seith, B., German patent application, 1996, 19628357.4
3. Vollath, D. and Szabó, D. V., Materials Letters, accepted for publication, 1997