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Volumn 14, Issue 3, 1999, Pages 815-828

Increasing thermal rating by risk analysis

Author keywords

Annealing; Impact; Probability; Risk; Sag; Temperature; Thermal ratings; Transmission

Indexed keywords

ANNEALING; ELECTRIC CONDUCTORS; MATHEMATICAL MODELS; OVERCURRENT PROTECTION; PROBABILITY; RANDOM PROCESSES; RISK ASSESSMENT; SPECIFIC HEAT; TEMPERATURE; THERMAL LOAD;

EID: 0032593008     PISSN: 08858950     EISSN: None     Source Type: Journal    
DOI: 10.1109/59.780891     Document Type: Article
Times cited : (135)

References (19)
  • 6
    • 0020764636 scopus 로고    scopus 로고
    • 1, Dynamic Ampacity Rating Algorithm", IEEE Transactions on Power Apparatus and Systems, Vol. PAS-102, No. 0, June 1983, pp.1858-64
    • Stephen D. Foss, Sheng H. Lin, Roosevelt A. Fernandes, "Dynamic Thermal Line Ratings, Part 1, Dynamic Ampacity Rating Algorithm", IEEE Transactions on Power Apparatus and Systems, Vol. PAS-102, No. 0, June 1983, pp.1858-64
    • Foss, Sheng H. Lin, Roosevelt A. Fernandes, "Dynamic Thermal Line Ratings, Part
    • Stephen, D.1
  • 7
    • 33747818271 scopus 로고    scopus 로고
    • Competition, Deregulation: Is the US rushing into the Dark?
    • Electrical World, October 1996, pp.17-36
    • Special Report, "Competition, Deregulation: Is the US rushing into the Dark?" Electrical World, October 1996, pp.17-36
    • Special Report


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.