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Volumn 58, Issue 4, 1999, Pages 387-397
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Investigation of the M/a-Si:H/c-Si structure as a Schottky contact with a diffusion barrier layer
a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
COST EFFECTIVENESS;
CURRENT VOLTAGE CHARACTERISTICS;
DIFFUSION IN SOLIDS;
ELECTRIC FIELDS;
ELECTRONIC DENSITY OF STATES;
HETEROJUNCTIONS;
INTERFACES (MATERIALS);
PHOTOELECTRIC CELLS;
SCHOTTKY BARRIER DIODES;
SOLAR CELLS;
AMORPHOUS HYDROGENATED SILICON CRYSTALLINE SILICON STRUCTURE;
CAPACITANCE VOLTAGE THEORY;
DIFFUSION BARRIER LAYER;
SCHOTTKY CONTACT;
AMORPHOUS SILICON;
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EID: 0032592970
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(99)00013-6 Document Type: Article |
Times cited : (5)
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References (14)
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