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Volumn 34, Issue 7, 1999, Pages 859-866

Evolution of the defect structure of zinc-oxide as a consequence of tribophysical activation

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTAL MICROSTRUCTURE; ELECTRON DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION; ZINC OXIDE;

EID: 0032592721     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4079(199908)34:7<859::AID-CRAT859>3.0.CO;2-4     Document Type: Article
Times cited : (9)

References (10)
  • 3
    • 77956900012 scopus 로고
    • Electronic processes in zinc oxide
    • ed. F. Seitz and N.Y. Turnbull, London, Acad.Press
    • HEILAND, G., MOLLARO, E., STOCKMANN, F.: Electronic processes in zinc oxide, Solid State Phys. ed. F. Seitz and N.Y. Turnbull, London, Acad.Press., 8 1959, 191-323
    • (1959) Solid State Phys. , vol.8 , pp. 191-323
    • Heiland, G.1    Mollaro, E.2    Stockmann, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.