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Volumn 540, Issue , 1999, Pages 67-72
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Orientation and temperature dependence of electron-induced crystallization in Si and Ge
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
CRYSTALLIZATION;
ELECTRON ENERGY LEVELS;
EPITAXIAL GROWTH;
GERMANIUM;
ION IMPLANTATION;
SILICON;
SUBSTRATES;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
AMORPHOUS ZONES;
ELECTRON INDUCED CRYSTALLIZATION;
THRESHOLD DISPLACEMENT ENERGY;
ELECTRON IRRADIATION;
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EID: 0032592225
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
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References (11)
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