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Volumn 540, Issue , 1999, Pages 67-72

Orientation and temperature dependence of electron-induced crystallization in Si and Ge

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLIZATION; ELECTRON ENERGY LEVELS; EPITAXIAL GROWTH; GERMANIUM; ION IMPLANTATION; SILICON; SUBSTRATES; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032592225     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (2)

References (11)
  • 1
    • 3843139346 scopus 로고
    • edited by J.M. Poate, G. Foti, and D.C. Jacobson Plénum Press, New York
    • J.S. Williams, in Surface Modification and Alloying, edited by J.M. Poate, G. Foti, and D.C. Jacobson (Plénum Press, New York, 1983) p. 133.
    • (1983) Surface Modification and Alloying , pp. 133
    • Williams, J.S.1
  • 6
    • 0002362040 scopus 로고
    • edited by J.M. Poate and J.W. Mayer Academic Press, New York
    • F. Spaepen and D. Turnbull, in: Laser Annealing of Semiconductors, edited by J.M. Poate and J.W. Mayer (Academic Press, New York, 1982), 15.
    • (1982) Laser Annealing of Semiconductors , pp. 15
    • Spaepen, F.1    Turnbull, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.