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Volumn 536, Issue , 1999, Pages 299-304
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Light induced ESR measurements on microcrystalline silicon with different crystalline volume fractions
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLINE VOLUME FRACTION;
MICROCRYSTALLINE SILICON;
PHOTOGENERATED CHARGE CARRIERS;
CHARGE CARRIERS;
CRYSTALLINE MATERIALS;
FERMI LEVEL;
INFRARED RADIATION;
LIGHTING;
PARAMAGNETIC RESONANCE;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
VOLUME FRACTION;
SEMICONDUCTING SILICON;
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EID: 0032591572
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (5)
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References (10)
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