Analysis of antimony-tin-based skutterudites

Materials Research Society Symposium - Proceedings

Volumn 545, Issue , 1999, Pages 47-51

  Schujman, S B ^a   Slack, G A ^a   Nguyen, H C ^a   Nolas, G S ^a   Young, R A ^a   Mohammed, F ^a   Tritt, T ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY COMPOUNDS; CHARGE CARRIERS; COMPOSITION; CRYSTAL DEFECTS; ELECTRONIC STRUCTURE; GLASS; X RAY DIFFRACTION ANALYSIS;

ANTIMONY TIN BASED SKUTTERDITES; PHONON GLASS; STRUCTURAL VOIDS;

TIN ALLOYS;

EID: 0032591255     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)