Thermoelectric and structural properties of Bi1-xTe1+x thin films on CdTe(111)

Materials Research Society Symposium - Proceedings

Volumn 545, Issue , 1999, Pages 177-181

  Kim, Yunki ^a   Cho, Sunglae ^a   DiVenere, Antonio ^a   Wong, George K ^a   Meyer, Jerry R ^a   Ketterson, John B ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CADMIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; ELECTRONS; FILM GROWTH; MOLECULAR BEAM EPITAXY; STOICHIOMETRY; STRUCTURE (COMPOSITION); SUBSTRATES; THERMOELECTRICITY; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINITY; HEXAGONAL PHASE; STRUCTURAL PROPERTIES; THERMOELECTRIC POWER; THERMOELECTRIC PROPERTIES;

THIN FILMS;

EID: 0032591227     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)