Fabrication, characterization and electronic properties of bismuth nanowire systems

Materials Research Society Symposium - Proceedings

Volumn 545, Issue , 1999, Pages 351-356

  Zhang, Zhibo B ^a   Dresselhaus, M S ^a   Ying, Jackie Y ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANISOTROPY; ASPECT RATIO; CRYSTAL STRUCTURE; ELECTRON GAS; ELECTRONICS PACKAGING; ETCHING; FERMI SURFACE; METALLIC MATRIX COMPOSITES; NANOTECHNOLOGY; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING TELLURIUM;

BISMUTH NANOWIRE SYSTEMS; PACKING DENSITIES; QUANTUM CONFINEMENT EFFECTS;

NANOSTRUCTURED MATERIALS;

EID: 0032591210     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)