Damage morphology of Kr ion tracks in apatite: dependence on dE/dX

Radiation Measurements

Volumn 31, Issue 1, 1999, Pages 65-70

  Villa, F ^a   Grivet, M ^a   Rebetez, M ^a   Dubois, C ^a   Chambaudet, A ^a   Chevarier, A ^b   Martin, P ^b   Brossard, F ^b   Blondiaux, G ^c   Sauvage, T ^c   Toulemonde, M ^d  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^b UNIVERSITÉ LYON 1   (France)

^c Ctr d'Etud Rech Par I   (France)

^d Centre Interdisciplinaire de Recherche Ions Lasers   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FISSION REACTIONS; ION BOMBARDMENT; KRYPTON; MORPHOLOGY; PARTICLE BEAM TRACKING; PHOSPHATES; POISSON RATIO; RUTHERFORD BACKSCATTERING SPECTROSCOPY; URANIUM;

APATITE; CHANNELISED RUTHERFORD BACKSCATTERING SPECTROMETRY; DAMAGE MORPHOLOGY; DEFECT FRAGMENTATION; FISSION TRACKS; KRYPTON ION TRACKS;

RADIATION DAMAGE;

EID: 0032590760     PISSN: 13504487     EISSN: None     Source Type: None    
DOI: 10.1016/S1350-4487(99)00081-5     Document Type: Article

References (6)

1. Carlson W.D. (1990). Mechanisms and Kinetics of Apatite Fission-Track Annealing. Amer. Min. 75, 1120-39.
2. Grivet M., Rebetez M., Chambaudet A. and Ben Ghouma N. (1993). Electron Microscopy Analysis of Krypton Ion-Tracks Induced in Durango Apatite. Nucl. Track Radiat. Meas. 22, 779-82.
3. Meftah A., Brisard F., Constantini J.M., Hage-Ali M., Stoquert J.P., Studer F. and Toulemonde M., 1993. Swift heavy ions in magnetic insulators: a damage cross-section velocity effect. Phys. Rev. B48, 920-5.
4. Paul T.A. and Fitzgerald P.G. (1992). Transmission Electron Microscopic Investigation of Fission-Tracks in Fluoroapatite. Amer. Mineral. 77, 336-44.
5. Toulemonde M. (1995). Defect Creation by Swift Heavy Ions: Material Modifications in the Electronic Stopping Power Regime. Appl. Radiat. Isot. 46, 375-81.
6. Villa F., Grivet M., Rebetez M., Dubois C. and Chambaudet A. (1997). Calibration and Simulation of Apatite Fission-Track Etching: Influence of Diffusion and Crystal Symmetry. Radiat. Meas. 28 (1-6), 543-48.