Beam profile measurement with CR-39 track detector for low-energy ions

Radiation Measurements

Volumn 31, Issue 1, 1999, Pages 253-256

  Sato, F ^a   Tanimura, Y ^a   Tanaka, T ^a   Iida, T ^a   Yamauchi, T ^b   Oda, K ^b  

^a OSAKA UNIVERSITY   (Japan)

^b KOBE UNIVERSITY OF MERCANTILE MARINE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DIGITAL IMAGE STORAGE; ETCHING; HELIUM; HYDROGEN; IMAGING SYSTEMS; ION BEAMS; OPTICAL RESOLVING POWER; PARTICLE BEAM TRACKING; POSITIVE IONS;

ION BEAM PROFILE; LOWER ENERGY IONS; NORMARSKI MICROSCOPE; TRACK DETECTOR;

PARTICLE DETECTORS;

EID: 0032590718     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(99)00119-5     Document Type: Article

References (4)

1. Tommasino, L., Zapparoli, G., Spiezia, P., Griffith, R.V. and Espinosa, G. (1984) Different etching processes of damage track detectors for personnel neutron dosimetry. Nucl. Tracks Radiat. Meas. 8, 335-339.
2. Cross, W.G., Arneja, A. and Ing, H. (1986) The response of electrochemically-etched CR-39 to protons of 10 keV to 3 MeV. Nucl. Tracks 12, 649-652.
3. Rosenfeld, A. and Kak, A.C. (1976) Digital Picture Processing, Academic Press, New York.
4. Ziegler, J.F., Biersack, J.P. and Littmark, U. (1985) The Stopping and Range of Ions in Solids, Pergamon Press, New York.