Tunneling in a double-barrier system and its practical implications for field ionization and field emission

Ultramicroscopy

Volumn 79, Issue 1-4, 1999, Pages 1-10

  Knor, Z ^a  

^a J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY   (Czech Republic)

Author keywords

048; Field emission; Field ionization; Surface reactivity

Indexed keywords

PLATINUM; TUNGSTEN;

ANISOTROPY; ARTICLE; CONTROLLED STUDY; DOUBLE BARRIER TUNNELING; ELECTRON DENSITY; ELECTRON MICROSCOPY; FIELD ION MICROSCOPY; IONIZATION; METHODOLOGY; NONHUMAN; SURFACE PROPERTY; VISIBILITY;

CHEMICAL BONDS; ELECTRON EMISSION; ELECTRON TUNNELING; INERT GASES; MATHEMATICAL MODELS;

FIELD EMISSION; FIELD IONIZATION;

IONIZATION OF GASES;

EID: 0032586253     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00053-4     Document Type: Article

References (32)

1. Knor Z., Müller E.W. Surf. Sci. 10:1968;21.
2. C.J. Chen, in: R. Wiesendanger, H.-J. Güntherodt (Eds.), Scanning Tunneling Microscopy III, Springer, Berlin, 1993; Scanning Microscopy 4 (1993) 141.
3. C.J. Chen, in: R. Wiesendanger, H.-J. Güntherodt (Eds.), Scanning Tunneling Microscopy III, Springer, Berlin, 1993; Scanning Microscopy 4 (1993) 141.
4. Forbes R.G. J. Phys. D. 18:1985;973.
5. Forbes R.G. Ultramicroscopy. 73:1998;31.
6. Tománek D., Sun Z., Louie S.G. Phys. Rev. B. 43:1991;4699.
7. Eichler A., Hafner J., Kresse G. J. Phys.: Condens. Matter. 8:1996;7659.
8. Mattheiss L.F., Hamann D.R. Phys. Rev. B. 29:1984;5372.
9. Suchorski Yu., Schmidt W.A., Block J.H. Appl. Surf. Sci. 76/77:1994;104.
10. Müller E.W., Tsong T.T. Field Ion Microscopy. 1969;Elsevier, New York.
11. Knor Z. J. Vac. Sci. Technol. 8:1971;57.
12. Z. Knor, in: J.R. Anderson, M., Boudart (Eds.), Catalysis - Sci. and Technol., Vol 3, Springer, Berlin, 1982, p. 231.
13. Knor Z., Plšek J. Collect. Czech. Chem. Commun. 63:1998;1851.
14. Müller E.W. J. Vac. Sci. Technol. 8:1971;89.
15. Müller E.W. J. Less-Common Met. 28:1972;37.
16. Kreuzer H.J. Surf. Sci. 246:1991;336.
17. H.J. Kreuzer, in: R. Vanselow, R. Howe (Eds.) Chemistry and Physics of Solid Surfaces 8, Springer Series in Surf. Sci. Vol. 22, Springer, Berlin, 1990, p. 133; J. Physique, Colloque C6, Supplément au No. 11, Tomme 49 (1988) C6-3.
18. H.J. Kreuzer, in: R. Vanselow, R. Howe (Eds.) Chemistry and Physics of Solid Surfaces 8, Springer Series in Surf. Sci. Vol. 22, Springer, Berlin, 1990, p. 133; J. Physique, Colloque C6, Supplément au No. 11, Tomme 49 (1988) C6-3.
19. Kreuzer H.J., Wang R.L.C. Z. Phys. Chem. 202:1997;127.
20. Heifets E.N., Diazadeh I., Guo J.-X., Stuchebrukhov A.A. J. Phys. Chem. A. 102:1998;2847.
21. Ernst N., Drachsel W., Block J.H., Kreuzer H.J. Phys. Rev. Lett. 57:1986;2686.
22. Wang S.C., Ehrlich G. Surf. Sci. 246:1991;37.
23. Knor Z. Chem. Phys. Lett. 201:1993;97.
24. Gomer R. Austral. J. Phys. 13:1960;391.
25. Penley J.C. Phys. Rev. 128:1962;896.
26. Šotola J., Knor Z. Appl. Surf. Sci. 31:1988;173.
27. Šotola J., Knor Z. J. Catal. 145:1994;501.
28. Knor Z., Šotola J. Surf. Sci. 213:1989;371.
29. Knor Z., Biehl St., Plšek J., Dvořák L. Chr. Edelmann. Vacuum. 51:1998;11.
30. Mingo N., Knor Z. Chem. Phys. Lett. 263:1996;8.
31. Schmickler W. Chem. Rev. 96:1996;3177.
32. Halbritter J., Repphun G., Vinzelberg S., Staikov G., Lorenz W.J. Electrochim. Act. 40:1995;1385.