Use of Goubau line to couple microwave signals generated by resonant laser-assisted field emission

Ultramicroscopy

Volumn 79, Issue 1-4, 1999, Pages 175-179

  Alonso, Kevin ^a   Hagmann, Mark J ^a  

^a The Department of Electrical and Computer Engineering   (United States)

Author keywords

048; Feild emission; Goubau; Microwaves; Surface wave

Indexed keywords

SILICON;

ARTICLE; CONTROLLED STUDY; ELECTRODE; FIELD EMISSION; LASER; METHODOLOGY; MICROWAVE RADIATION; NONHUMAN; SURFACE PROPERTY;

COMPUTER SIMULATION; DIELECTRIC FILMS; FIELD EMISSION CATHODES; LASER APPLICATIONS; LASER BEAM EFFECTS; MATHEMATICAL MODELS; MICROWAVES; PHOTOELECTRICITY; SURFACE WAVES;

GOUBAU LINE; RESONANT LASER ASSISTED FIELD EMISSION;

ELECTRON EMISSION;

EID: 0032586229     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00086-8     Document Type: Article

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