Preparation and size effect on concentration quenching of nanocrystalline Y2SiO5:Eu

Chemical Physics Letters

Volumn 292, Issue 1-2, 1998, Pages 133-136

  Zhang, Weiping ^a,b,c   Xie, Pingbo ^a   Duan, Changkui ^a   Yan, Kuo ^a   Yin, Min ^a   Lou, Liren ^a,b   Xia, Shangda ^a   Krupa, Jean Claude ^d  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b CHANGCHUN INSTITUTE OF OPTICS   (China)

^c Peking University   (China)

^d Orsay Campus   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032584415     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(98)00656-3     Document Type: Article

References (6)

1. Bhargava R.N., Gallagher D., Welker T. J. Lumin. 60/61:1994;275.
2. Bhargava R.N., Gallagher D., Hong X., Nurmikko A. Phys. Rev. Lett. 72:1994;416.
3. Li C., Wyon C., Moncorge R. IEEE J. Quant. Electron. 28:1992;1209.
4. Peters T.E. J. Electrochem. Soc. 116:1969;985.
5. Mitsunaga M., Yano R., Uesugi N. Opt. Lett. 16:1991;1890.
6. Heber J., Hellwege K.H., Köbler U., Murmann H. Z. Phys. 237:1970;189.