p-Toluenesulfonyl esters of perfluorinated tertiary alcohols: Crystal structure determination of the absolute configuration of C6F5(CF3)2COSO2C6H4CH3

Journal of Fluorine Chemistry

Volumn 89, Issue 1, 1998, Pages 19-22

  Krumm, Burkhard ^a   Vij, Ashwani ^a   Kirchmeier, Robert L ^a   Shreeve, Jean'ne M ^a  

^a UNIVERSITY OF IDAHO   (United States)

Author keywords

p Toluenesulfonyl chloride; p Toluenesulfonyl esters; Perfluorinated tertiary alcohols

Indexed keywords

EID: 0032580004     PISSN: 00221139     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-1139(98)00080-3     Document Type: Article

References (10)

1. [1] Houben-Weyl, Methoden der Organischen Chemie, Georg Thieme Verlag, Stuttgart IX, 1955. p. 663.
2. [2] C. Tamborski, W.H. Burton, L.W. Breed, J. Org. Chem. 31 (1966) 4229.
3. [3] B. Krumm, A. Vij, R.L. Kirchmeier, J.M. Shreeve, Inorg. Chem. 36 (1997) 366.
4. [4] V.M. Kanagasabapathy, J.F. Sawyer, T.T. Tidwell, J. Org. Chem. 50 (1985) 503.
5. [5] P.G. Gassman, N.J. O'Reilly, J. Org. Chem. 52 (1987) 2481.
6. [6] C.F. Campana, D.F. Shepard, W.M. Litchman, Inorg. Chem. 20 (1980) 4039.
7. [7] SMART V 4.043 Software for the CCD Detector System, Siemens Analytical Instruments Division, Madison, WI, USA, 1995.
8. [8] SAINT V 4.035 Software for the CCD Detector System, Siemens Analytical Instruments Division, Madison, WI, USA, 1995.
9. [9] G.M. Sheldrick (1990), SHELXS-90 incorporated in SHELXTL-Plus Software V 5.03, Siemens Analytical Instruments Division. Madison, WI, USA, 1995.
10. [10] SHELXTL-Plus V 5.03 Software, Siemens Analytical Instruments Division. Madison. WI, USA, 1995.