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Volumn 37, Issue 27, 1998, Pages 6550-6557

Differential absorption mueller matrix spectroscopy and the infrared detection of crystalline organics

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE LASERS; CONTINUOUS WAVE LASERS; CRYSTALLINE MATERIALS; DIFFRACTION GRATINGS; INFRARED SPECTROMETERS; LIGHT MODULATORS; MATRIX ALGEBRA; NEURAL NETWORKS; ORGANIC COMPOUNDS; PATTERN RECOGNITION SYSTEMS; PHOTODETECTORS;

EID: 0032552293     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.006550     Document Type: Article
Times cited : (14)

References (19)
  • 1
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    • (1981) Polarimeter , vol.4
    • Azzam, R.M.1
  • 7
    • 0015692899 scopus 로고
    • A new polarization-modulated light scattering instrument
    • A. J. Hunt and D. R. Huffman, “A new polarization-modulated light scattering instrument, ” Rev. Sci. Instrum. 44, 1753-1762(1973).
    • (1973) Rev. Sci. Instrum. , vol.44 , pp. 1753-1762
    • Hunt, A.J.1    Huffman, D.R.2
  • 8
    • 0019004115 scopus 로고
    • Measurement of polarized light interactions via the Mueller matrix
    • R. C. Thompson, J. R. Bottiger, and E. S. Fry, “Measurement of polarized light interactions via the Mueller matrix, ” Appl. Opt. 19, 1323-1329 (1980).
    • (1980) Appl. Opt. , vol.19 , pp. 1323-1329
    • Thompson, R.C.1    Bottiger, J.R.2    Fry, E.S.3
  • 9
    • 0028511785 scopus 로고
    • Mueller matrix analysis of infrared ellipsometry
    • E. Wold and J. Bremer, “Mueller matrix analysis of infrared ellipsometry, ” Appl. Opt. 33, 5982-5993 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 5982-5993
    • Wold, E.1    Bremer, J.2
  • 11
    • 0016911790 scopus 로고
    • Error calculation of polarization measurements
    • M. A. F. Thiel, “Error calculation of polarization measurements, ” J. Opt. Soc. Am. 66, 65-67 (1976).
    • (1976) J. Opt. Soc. Am. , vol.66 , pp. 65-67
    • Thiel, M.A.F.1
  • 14
    • 0020130310 scopus 로고
    • Die Anwendung der Mueller matrix auf die spektroskopische Infrarot-Ellipsometrie mit dem Fourierspektrometer
    • A. Roseler, “Die Anwendung der Mueller matrix auf die spektroskopische Infrarot-Ellipsometrie mit dem Fourierspektrometer, ” Optik (Stuttgart) 61, 177-186 (1981).
    • (1981) Optik (Stuttgart) , vol.61 , pp. 177-186
    • Roseler, A.1
  • 17
    • 0009345489 scopus 로고
    • Carbon dioxide lasers
    • D. W. Goodwin, edAcademic, London
    • D. C. Tyte, “Carbon dioxide lasers, ” in Advances in Quantum Electronics, D. W. Goodwin, ed. (Academic, London, 1970), Vol. 1.
    • (1970) Advances in Quantum Electronics , vol.1
    • Tyte, D.C.1
  • 18
    • 85010149078 scopus 로고
    • 1st edSigma Chemical Co., St. Louis, MO
    • R. J. Keller, ed., The Sigma Library of FT-IR Spectra, 1st ed. (Sigma Chemical Co., St. Louis, MO., 1986), Vols. 1-2.
    • (1986) The Sigma Library of FT-IR Spectra , vol.1 , Issue.2
    • Keller, R.J.1
  • 19
    • 85010094125 scopus 로고
    • 1st edAldrich Chemical Company, Inc., Milwaukee, Wis
    • C. J. Pouchert, ed., The Aldrich Library of FT-IR Spectra, 1st ed., (Aldrich Chemical Company, Inc., Milwaukee, Wis., 1989), Vols. 1-3.
    • (1989) The Aldrich Library of FT-IR Spectra , vol.1 , Issue.3
    • Pouchert, C.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.