In situ monitoring of copper(II) fixation on silica gel in aqueous ammonia by means of dielectric measurements and quantitative analysis of adsorbed species

Analytica Chimica Acta

Volumn 361, Issue 3, 1998, Pages 273-283

  Walcarius, A ^a   Bessiere J ^a  

^a Laboratoire de Chimie Physique et Microbiologie pour l'Environnement   (France)

Author keywords

Ammonia; Copper; Impedance; Silica gel; Silica modified electrode; XPS

Indexed keywords

AMMONIA; COPPER; SILICA GEL;

ADSORPTION; ANALYTIC METHOD; AQUEOUS SOLUTION; ARTICLE; COMPLEX FORMATION; DIELECTRIC CONSTANT; ELECTRON SPIN RESONANCE; LIGAND BINDING; MONITORING; NONHUMAN; PRIORITY JOURNAL; QUANTITATIVE ASSAY;

SIO;

EID: 0032540458     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(98)00032-4     Document Type: Article

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