The use of projected area distribution functions in particle shape measurement

Powder Technology

Volumn 98, Issue 3, 1998, Pages 250-257

  Brown, D J ^a   Vickers, G T ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Light scattering; Particle shape; Projected area

Indexed keywords

COMPUTATIONAL METHODS; FUNCTIONS; IMAGE ANALYSIS; LIGHT SCATTERING; RANDOM PROCESSES; SPATIAL VARIABLES MEASUREMENT;

DISTRIBUTION FUNCTIONS; MAXIMUM LIKELIHOOD METHOD;

PARTICLE SIZE ANALYSIS;

ARTICLE; CALCULATION; IMAGE ANALYSIS; LIGHT SCATTERING; ORIENTATION; PARTICLE SIZE;

EID: 0032529378     PISSN: 00325910     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-5910(98)00066-7     Document Type: Article

References (3)

1. [1] A.G. Walters, The distribution of projected areas of fragments, Proc. Cambridge Philos. Soc. 43 (1947) 342-347.
2. [2] G.T. Vickers, The projected areas of ellipsoids and cylinders, Powder Technol. 86 (1996) 195-200.
3. [3] H. Umhauer, A. Gutsch, Particle characterization by projected area determination, Part. Part. Syst. Charact. 14 (1997) 105-115.