Short-period X-ray multilayers based on Cr/Sc, W/Sc

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 405, Issue 2-3, 1998, Pages 292-296

  Salashchenko, N N ^a   Fraerman, A A ^a   Mitenin, S V ^a   Prokhorov, K A ^a   Shamov, E A ^a  

^a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; LIGHT REFLECTION; METALLIC SUPERLATTICES; SCANDIUM; TUNGSTEN; X RAYS;

BREWSTER'S INCIDENCE ANGLE; REFLECTION COEFFICIENTS;

MIRRORS;

EID: 0032507057     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00163-0     Document Type: Article

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