The application of the atom label method to studying surface structure of the carbon deposited nickel particles by using EXAFS

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 405, Issue 2-3, 1998, Pages 382-383

  Kriventsov, V V ^a   Novgorodov, B N ^a   Kochubey, D I ^a  

^a BORESKOV INSTITUTE OF CATALYSIS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CARBON; HYDROGEN INORGANIC COMPOUNDS; NICKEL; PARTICLES (PARTICULATE MATTER); SURFACE STRUCTURE;

ATOM LABEL METHOD; EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 0032507049     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00158-7     Document Type: Article

References (3)

1. E.S. Cruissink, L.L. Van-Rien and J.R.H. Ross, J. Chem. Soc. Far. Trans. I 77 (1981) 649.
2. D.I. Kochubey, EXAFS spectroscopy of catalysts, Novosibirsk, Nauka (1992) 146 (in Russian).
3. N. Binsted, J.V. Campbell, S.J. Gurman and P.C. Stephenson, SERC Daresbury Laboratory EXCURVE-92 programm (1991).