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Volumn 295, Issue 3, 1998, Pages 245-248
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Monolayer X-ray reflectometry at the air-water interface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032500466
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/S0009-2614(98)00964-6 Document Type: Article |
Times cited : (19)
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References (19)
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