Scanning probe microscopic characterization of surface-modified n-TiO2 single-crystal electrodes

Langmuir

Volumn 14, Issue 12, 1998, Pages 3405-3410

  Miki, Takeshi ^a   Yanagi, Hisao ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSIS; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; DEPOSITION; ENERGY GAP; ETCHING; OXIDATION; PHOTOCHEMICAL REACTIONS; SINGLE CRYSTALS; TITANIUM DIOXIDE; ULTRAVIOLET RADIATION;

PHOTOCATALYSIS; PHOTOELECTROCHEMISTRY; RUTILE; SCANNING PROBE MICROSCOPY;

ELECTROCHEMICAL ELECTRODES;

EID: 0032499546     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la971099z     Document Type: Article

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