Sample temperature measurement in a scanning near-field optical microscope

Applied Physics Letters

Volumn 72, Issue 6, 1998, Pages 689-691

  Kazantsev, D ^a   Guttroff, G ^b   Bayer, M ^b   Forchel, A ^b  

^a INSTITUTE FOR THEORETICAL AND EXPERIMENTAL PHYSICS   (Russian Federation)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRON BEAM LITHOGRAPHY; ELECTRON ENERGY LEVELS; ELECTRONIC DENSITY OF STATES; LASER BEAMS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; OPTICAL FIBERS; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; PHOTONS; SEMICONDUCTING GALLIUM ARSENIDE;

CARRIER DISTRIBUTION; RADIATIVE RECOMBINATION; SCANNING NEAR FIELD OPTICAL MICROSCOPE;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0032498479     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120847     Document Type: Article

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