Analysis of the melting temperatures of RTX2 (CeNiSi2 structure) and RT2X2 (CeGa2Al2 structure) compounds [R=La,Ce,Sm,Er,Tm; T=Fe,Co,Ni; X=Si,Ge]

Journal of Alloys and Compounds

Volumn 264, Issue 1-2, 1998, Pages 190-196

  Morozkin, A V ^a   Seropegin, Yu D ^a   Gribanov, A V ^a   Sviridov, I A ^a   Kurenbaeva, J M ^a   Kurenbaev, A L ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

Crystal structure; Melting temperature; Ternary rare earth germanides; Ternary rare earth sulicides

Indexed keywords

CRYSTAL STRUCTURE; DIFFERENTIAL THERMAL ANALYSIS; MELTING; TEMPERATURE MEASUREMENT; TERNARY SYSTEMS; X RAY CRYSTALLOGRAPHY;

X RAY PHASE ANALYSIS;

CERIUM ALLOYS;

EID: 0032498077     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(97)00231-4     Document Type: Article

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