Microstructural study of boron doped diamond films by X-ray diffraction profiles analysis

Thin Solid Films

Volumn 322, Issue 1-2, 1998, Pages 143-147

  Brunet, F ^a   Germi, P ^a   Pernet, M ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Boron doped diamond films; Line profile; X ray diffraction pattern

Indexed keywords

BORON; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); MATHEMATICAL MODELS; X RAY CRYSTALLOGRAPHY;

CAUCHY FUNCTION; GAUSS FUNCTION;

DIAMOND FILMS;

EID: 0032496511     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00925-5     Document Type: Article

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