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Volumn 322, Issue 1-2, 1998, Pages 198-205

Redox reaction at the two-layer interface between aluminum and electropolymerized poly(3-methylthiophene) thin solid films

(6) Uehara, K a Ichikawa, T a Serikawa, T a Yoshikawa, S b Ehara, S c Tsunooka, M a

a Osaka Prefecture University (Japan)

b Government Industrial Research Institute Ikeda (Japan)

c Ion Engineering Research Institute (Japan)

Author keywords

Aluminum corrosion; Dopant anion; Poly(3 methyl thiophene); Redox reaction; SEM; Spectra

Indexed keywords

ALUMINUM CORROSION; ELECTROPOLYMERIZATION; FILM GROWTH; GOLD; INTERFACES (MATERIALS); PLASTIC FILMS; REDOX REACTIONS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VACUUM DEPOSITED COATINGS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL UNDOPING; POLYMETHYLTHIOPENES;

CONDUCTIVE FILMS;

EID: 0032496480 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00909-7 Document Type: Article

Times cited : (13)

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