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Volumn 31, Issue 13, 1998, Pages 1548-1555
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Atomic focusers
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELD EFFECTS;
ELECTRON BEAMS;
FOCUSING;
PIEZOELECTRIC DEVICES;
PROBES;
SCANNING ELECTRON MICROSCOPY;
ATOMIC FOCUSERS;
ELECTRON LENSES;
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EID: 0032493215
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/31/13/008 Document Type: Article |
Times cited : (11)
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References (7)
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