Interreaction of Cu/Au thin films observed by high angle hollow cone darkfield electron microscopy

Scripta Materialia

Volumn 39, Issue 1, 1998, Pages 79-85

  Harrtung, F ^a   Ewert, J C ^a   Dzick, J ^a   Schmitz, G ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; GOLD; GRAIN BOUNDARIES; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); NUCLEATION; SINGLE CRYSTALS; SURFACE ROUGHNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

HOLLOW CONE DARK FIELD (HCDF) ELECTRON MICROSCOPY;

METALLIC FILMS;

EID: 0032485956     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1359-6462(98)00135-3     Document Type: Article

References (10)

1. S. J. Pennycook, S. D. Berger, and R. J. Culbertson, J. Microsc. 144, 229 (1986).
2. M. M. J. Treacy and J. M. Gibson, Ultramicroscopy. 52, 31 (1993).
3. G. Schmitz and F. Haider, Scripta Mater. 37, 1951 (1997).
4. J. C. Ewert, F. Hartung, and G. Schmitz, Appl. Phys. Lett. 71, 1311 (1997).
5. P. M. Hall, J. M. Morabito, and N. T. Panousis, Thin Solid Film. 41, 341 (1977).
6. Landolt-Börnstein, Diffusion in Solid Metals, Springer-Verlag, New York (1990).
7. R. Pretorius, T. K. Marais, A. E. Muller, and D. Knoessen, Mater. Res. Soc. Symp. Proc. 238, 485 (1992).
8. K. N. Tu and B. S. Berry, J. Appl. Phys. 43, 3283 (1972).
9. K. R. Coffey, L. A. Clevenger, K. Barmak, D. A. Rudman, and C. V. Thompson, Appl. Phys. Lett. 55, 852 (1989).
10. Scripta Materialia, Vol. 39, No. 1, pp. 1-5, 1998