Oxide scale stress determination by Raman spectroscopy application to the NiCr/Cr2O3 system and influence of yttrium

Scripta Materialia

Volumn 38, Issue 11, 1998, Pages 1649-1658

  Calvarin, G ^a   Huntz, A M ^a   Hugot Le Goff, A ^a   Joiret, S ^a   Bernard, M C ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; COMPOSITION EFFECTS; COMPRESSIVE STRESS; OXIDATION RESISTANCE; OXIDES; RAMAN SPECTROSCOPY; RATE CONSTANTS; RESIDUAL STRESSES; SCALE (DEPOSITS); STRESS RELAXATION; THERMAL STRESS; YTTRIUM;

CHROMIUM DIOXIDE;

NICKEL ALLOYS;

EID: 0032485634     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(98)00079-7     Document Type: Article

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