The spin-polarized scanning electron microscope observation of 0.1 μm marks recorded by magnetic field modulation on a magneto-optical recording disk

Applied Physics Letters

Volumn 72, Issue 1, 1998, Pages 124-126

  Kohashi, Teruo ^a   Matsuyama, Hideo ^a   Koike, Kazuyuki ^a   Murakami, Yoshiteru ^b   Tanaka, Yasuhito ^a   Awano, Hiroyuki ^c  

^a HITACHI LTD   (Japan)

^b SHARP CORPORATION   (Japan)

^c HITACHI MAXELL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ION BOMBARDMENT; LASER BEAMS; LENSES; MAGNETIC FIELDS; MAGNETIZATION; OPTICAL RECORDING; SCANNING ELECTRON MICROSCOPY;

MAGNETIC FIELD MODULATION; MAGNETOOPTICAL DRIVE SYSTEM; MAGNETOOPTICAL RECORDING DISK; SPIN POLARIZED SCANNING ELECTRON MICROSCOPE;

MAGNETOOPTICAL DEVICES;

EID: 0032484443     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120666     Document Type: Article

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