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Volumn 334, Issue 1-2, 1998, Pages 113-116
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The preparation and gas sensitive property of Pt-WO3 thin film
a
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Author keywords
Optical density (OD); X Ray diffraction (XRD)
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Indexed keywords
DENSITY MEASUREMENT (OPTICAL);
EVAPORATION;
FILM PREPARATION;
HYDROGEN;
SEMICONDUCTING GLASS;
THIN FILMS;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
THERMAL EVAPORATION;
SEMICONDUCTING FILMS;
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EID: 0032483877
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(98)01127-4 Document Type: Article |
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Times cited : (9)
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References (7)
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