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Volumn 279, Issue 1, 1998, Pages 60-65

A plasma kinetics model: Analysis of wall loss reactions in dry etching of silicon dioxide

Author keywords

Composition; Plasma chemistry; Surface reaction

Indexed keywords

ADSORPTION; DISSOCIATION; MATHEMATICAL MODELS; PLASMA DENSITY; PLASMA ETCHING; REACTION KINETICS; SURFACE PHENOMENA; SURFACE STRUCTURE;

EID: 0032483285     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(98)00612-4     Document Type: Article
Times cited : (10)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.