Cu-Ti surface-layer mixing by ion-beam modification techniques

Surface and Coatings Technology

Volumn 106, Issue 2-3, 1998, Pages 145-149

  Laverentiev, Vasily ^a   Adeev, Vadim ^a   Kotko, Andrey ^a   Tolopa, Alexander ^b  

^a Institute of Surface Modification   (Ukraine)

^b INSTITUTE OF APPLIED PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEFECTS; ION BEAMS; ION IMPLANTATION; ION SOURCES; MATHEMATICAL MODELS; PARTICLE SIZE ANALYSIS; SURFACE TREATMENT; THERMODYNAMICS; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE LAYER MODEL;

COPPER ALLOYS;

COATING; CORROSION RESISTANCE; ION IMPLANTATION;

EID: 0032483146     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(98)00510-6     Document Type: Article

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