Simulation and analysis of X-ray photoemission and Auger valence band spectra of hydrogenated amorphous silicon

Thin Solid Films

Volumn 326, Issue 1-2, 1998, Pages 160-165

  Clare, B W ^a   Jennings, P J ^a   Lund, C P ^a   Cornish, J C L ^a   Hefter, G T ^a  

^a MURDOCH UNIVERSITY   (Australia)

Author keywords

Amorphous materials; Auger electron spectroscopy; Silicon; X Ray photoelectron spectroscopy

Indexed keywords

AMORPHOUS SILICON; AUGER ELECTRON SPECTROSCOPY; CALCULATIONS; HYDROGENATION; QUANTUM THEORY; X RAY PHOTOELECTRON SPECTROSCOPY;

QUANTUM CHEMICAL CALCULATIONS;

THIN FILMS;

EID: 0032482876     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00567-7     Document Type: Article

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