The role of experimental error in arrhenius plots: Self-diffusion in semiconductors

Solid State Communications

Volumn 107, Issue 4, 1998, Pages 159-163

  Dunstan, D J ^a  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ERROR COMPENSATION; MATHEMATICAL MODELS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; TEMPERATURE;

ARRHENIUS PLOTS; EXPERIMENTAL ERROR;

DIFFUSION IN SOLIDS;

EID: 0032478936     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(98)00172-0     Document Type: Article

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