Solvent relaxation NMR measurements on polymer, particle, surfactant systems

Langmuir

Volumn 14, Issue 5, 1998, Pages 997-1001

  Mears, S J ^a   Cosgrove, T ^a   Thompson, L ^b   Howell, I ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNILEVER RESEARCH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; INTERFACES (MATERIALS); MOLECULAR DYNAMICS; POLYETHYLENES; SILICA; SODIUM COMPOUNDS; SOLVENTS; SURFACE ACTIVE AGENTS;

POLYETHYLENE OXIDE; SODIUM DODECYL SULFATE;

NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;

EID: 0032477987     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970744z     Document Type: Article

References (8)

1. Cosgrove, T.; Mears S. J.; Thompson, L.; Howell, I. ACS Symp. Ser. 1996, 615, 196.
2. Mears, S. J.; Cosgrove, T.; Obey, T.; Thompson, L.; Howell, I. In preparation.
3. van der Beek, G. P.; Cohen Stuart, M. A.; Cosgrove, T. Langmuir 1991, 7, 327.
4. Carr, Y. H.; Purcell, E. M. Phys. Rev. 1954, 94, 630.
5. Meiboom, S.; Gill, D. Rev. Sci. Instrum. 1958, 29, 688.
6. Snowtex Data Sheets; Nissan Chemical Industries Ltd., Specitality Chemicals Division: Tokyo, Japan.
7. Nuysink, J.; Koopal, L. K. Talanta 1982, 29, 495.
8. Cosgrove, T.; Griffiths, P. C.; Lloyd, P. M. Langmuir 1995, 11 (5), 1457.