A novel method for automatic image analysis of particle size distribution in zircaloy based on secondary electrons in stem

Scripta Materialia

Volumn 38, Issue 5, 1998, Pages 775-781

  Liu, P ^a   Ornhagen C ^a   Nilsson, J O ^a  

^a SANDVIK MATERIALS TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; IMAGE ANALYSIS; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; SURFACE TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

SECONDARY ELECTRONS; ZIRCALOY;

ZINC ALLOYS;

EID: 0032477627     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(97)00543-5     Document Type: Article

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