Characterizing and modeling the apparent anomalous behavior of resistivity in Cr-Si-O thin films

Thin Solid Films

Volumn 332, Issue 1-2, 1998, Pages 272-276

  Jankowski, Alan F ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Cr Si O cermet; Effective medium theory; Reactive sputtering; Resitivity

Indexed keywords

CERMETS; ELECTRIC CONDUCTIVITY MEASUREMENT; SPUTTER DEPOSITION; THIN FILMS;

EFFECTIVE MEDIUM THEORY;

CERAMIC COATINGS;

EID: 0032476280     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01098-0     Document Type: Article

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