메뉴 건너뛰기




Volumn 193, Issue 4, 1998, Pages 720-727

Growth and wetting angles as the control parameters of crystal shape in Czochralski method

Author keywords

Czochralski method; Germanium crystal; Growth angle; Silicon crystal; Wetting angle

Indexed keywords

ANISOTROPY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; WETTING;

EID: 0032475670     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00499-0     Document Type: Article
Times cited : (6)

References (43)
  • 10
    • 0002431632 scopus 로고
    • W.E. Kingston (Ed.), McGraw-Hill, New York
    • G. Herring, in: W.E. Kingston (Ed.), The Physics of Powder Metallurgy, McGraw-Hill, New York, 1951, p. 143.
    • (1951) The Physics of Powder Metallurgy , pp. 143
    • Herring, G.1
  • 35
    • 84915072339 scopus 로고
    • Consultant Bureau, New York
    • P.I. Antonov, in: Rost Cristallov, vol. 6a, Consultant Bureau, New York, 1968, p. 145.
    • (1968) Rost Cristallov , vol.6 A , pp. 145
    • Antonov, P.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.