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Volumn 193, Issue 4, 1998, Pages 720-727
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Growth and wetting angles as the control parameters of crystal shape in Czochralski method
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Author keywords
Czochralski method; Germanium crystal; Growth angle; Silicon crystal; Wetting angle
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Indexed keywords
ANISOTROPY;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTING SILICON;
WETTING;
CRYSTAL SHAPE;
WETTING ANGLE;
CRYSTAL GROWTH FROM MELT;
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EID: 0032475670
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(98)00499-0 Document Type: Article |
Times cited : (6)
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References (43)
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